Nanomedicine and Nanoscience Technology: Open Access
Particle Beam Caused Charge (IBIC) Microscopy Technique with Energies in the MeV Range for Examination of Cancer Cells, Tissues and Tumors Elimination
Abstract
Particle Beam Caused Charge (IBIC) microscopy (did/done/finished) involving exceptionally tuned bacterium’s of quick particles with energies in the MeV range is the amazing asset for examination of charge transporter transport properties in (component used to make electronic circuits) gadgets in light of (component used to make electronic circuits) hetero-(associating point/joining point), metal-on-(component used to make electronic circuits) and (component used to make electronic circuits)- on-cover arrangements.